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A Nonparametric Two-Dimensional Display for Classification
by
Fukunaga, Keinosuke
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Mantock, James M.
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IEEE transactions on pattern analysis and machine intelligence
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Casualty Handling Simulation Using the Scenario-based Engineering Process
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Mantock, James M
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Gately, Michael T
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Systematic Feature Extraction
by
Brakke, Kenneth A.
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Mantock, James M.
,
Fukunaga, Keinosuke
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IEEE transactions on pattern analysis and machine intelligence
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