Search Results - Maru, Akifumu

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    Characterization of Microdose Damage Caused by Single Heavy Ion Observed in Trench Type Power MOSFETs

    Characterization of Microdose Damage Caused by Single Heavy Ion Observed in Trench Type Power MOSFETs by Kuboyama, Satoshi, Maru, Akifumu, Ikeda, Naomi, Hirao, Toshio, Tamura, Takashi

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