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Thickness measurement of nm HfO2 films
by
Kim, K J
,
Kim, A
,
Kim, C S
,
Song, S W
,
Ruh, H
,
Unger, W E S
,
Radnik, J
,
Mata-Salazar, J
,
Juarez-Garcia, J M
,
Cortazar-Martinez, O
,
Herrera-Gomez, A
,
Hansen, P E
,
Madesen, J S
,
Senna, C A
,
Archanjo, B S
,
Damasceno, J C
,
Achete, C A
,
Wang, H
,
Wang, M
,
Windover, D
,
Steel, E
,
Kurokawa, A
,
Fujimoto, T
,
Azuma, Y
,
Terauchi, S
,
Zhang, L
,
Jordaan, W A
,
Spencer, S J
,
Shard, A G
,
Koenders, L
,
Krumrey, M
,
Busch, I
,
Jeynes, C
Published in
Metrologia
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Loading…
Thickness measurement of nm HfO 2 films
by
Kim, K J
,
Kim, A
,
Kim, C S
,
Song, S W
,
Ruh, H
,
Unger, W E S
,
Radnik, J
,
Mata-Salazar, J
,
Juarez-Garcia, J M
,
Cortazar-Martinez, O
,
Herrera-Gomez, A
,
Hansen, P E
,
Madesen, J S
,
Senna, C A
,
Archanjo, B S
,
Damasceno, J C
,
Achete, C A
,
Wang, H
,
Wang, M
,
Windover, D
,
Steel, E
,
Kurokawa, A
,
Fujimoto, T
,
Azuma, Y
,
Terauchi, S
,
Zhang, L
,
Jordaan, W A
,
Spencer, S J
,
Shard, A G
,
Koenders, L
,
Krumrey, M
,
Busch, I
,
Jeynes, C
Published in
Metrologia
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Peer Reviewed
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Journal Title
Metrologia
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Subjects
Attenuation
1 results
1
Backscattering
1 results
1
General Engineering
1 results
1
Hafnium Oxide
1 results
1
Instruments & Instrumentation
1 results
1
Ion Scattering
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1
Ion Scattering Spectroscopy
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1
Photoelectrons
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Physical Sciences
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1
Physics
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1
Physics, Applied
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1
Science & Technology
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1
Spectroellipsometry
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1
Surface Analysis
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Technology
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Thickness Measurement
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X Ray Fluorescence Analysis
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X Ray Photoelectron Spectroscopy
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Institute Of Physics:jisc Collections:iop Publishing Journal Archive 1874-1998 (Access Period 2020 To 2024)
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Institute Of Physics:jisc Collections:iop Publishing Read And Publish 2024-2025 (Reading List)
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Institute Of Physics Iopscience Extra
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