Characterization of structures from X-ray scattering data using genetic algorithms by Wormington, Matthew, Panaccione, Charles, Matney, Kevin M., Bowen, D. Keith

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Multi-Isotope determination of uranium-rich material using accelerator mass spectrometry by Clark, Adam M., Nelson, Austin D., Bailey, Thomas L., Blankstein, Drew, Boomershine, Chevelle, Brown, Gunnar M., Burns, Peter C., Carmichael, Scott, Callahan, Lauren K., Koros, Jes, Lee, Kevin, Matney, Miriam, Miller, Anthony M., Olivas-Gomez, Orlando, Paul, Michael, Pardo, Richard, Rivero, Fabio, Robertson, Daniel, Sigmon, Ginger E., von Seeger, William W., Stech, Ed, Zite, Regan, Collon, Philippe

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(Invited) Processing Technologies for Advanced Ge Devices by Loo, Roger, Hikavyy, Andriy Yakovitch, Witters, Liesbeth, Schulze, Andreas, Arimura, Hiroaki, Cott, Daire, Mitard, Jerome, Porret, Clement, Mertens, Hans, Ryan, Paul, Wall, John, Matney, Kevin, Wormington, Matthew, Favia, Paola, Richard, Olivier, Bender, Hugo, Horiguchi, Naoto, Collaert, Nadine, Thean, Aaron

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Application of Inline X-ray Metrology for Defect Characterization of III-V/Si Heterostructures by Hung, P.Y., Wormington, Matthew, Matney, Kevin, Ryan, Paul, Dunn, Kathleen, Wang, Albert, Hill, Richard, Wong, Man-Hoi, Price, Jimmy, Wang, Wei-E, Bersuker, Gennadi

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