Search Results - McKindles, Derek

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    Electron beam inspection: CDU dual-mode inspection and lithography ghost image detection

    Electron beam inspection: CDU dual-mode inspection and lithography ghost image detection by Hafer, Richard F., Patterson, Oliver D., McKindles, Derek, Hsieh, Brian Yueh-Ling

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    Optimizing Wet Clean operations in an established manufacturing environment

    Optimizing Wet Clean operations in an established manufacturing environment by Van Roijen, Raymond, Hilscher, David F., Meagher, Colleen, Rettmann, Ryan, McKindles, Derek

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