Evidence for motivated control: Understanding the paradoxical link between threat and efficacy beliefs about climate change by Hornsey, Matthew J., Fielding, Kelly S., McStay, Ryan, Reser, Joseph P., Bradley, Graham L., Greenaway, Katharine H.

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Are People High in Skepticism About Anthropogenic Climate Change Necessarily Resistant to Influence? Some Cause for Optimism by Hornsey, Matthew J., Fielding, Kelly S., McStay, Ryan, Reser, Joseph P., Bradley, Graham L.

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Optimising the Use of Procedural Beds: Time for an Intervention by Healy, O, McStay, M, Mannion, H, Reynolds, I S, Ryan, J, Winter, D C

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Deposited ALD SiO2 High-k/Metal Gate Interface for High Voltage Analog and I/O Devices on Next Generation Alternative Channels and FINFET Device Structures by Siddiqui, Shahab, Chowdhury, Murshed M, Brodsky, Maryjane, Rahim, Nilufa, Dai, Min, Krishnan, Siddarth, Fugardi, Steve, Wu, Ernest, Chou, Anthony, Narasimha, Shreesh, Li, Jinghong, Mcstay, Kevin, Linder, Barry, Maciejewski, Edward, Rettmann, Ryan, Mittl, Steven, Kwon, Unoh, Narayanan, Vijay, Henson, William, Schepis, Dominic, Chudzik, Michael

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Deposited ALD SiO 2 High-k/Metal Gate Interface for High Voltage Analog and I/O Devices on Next Generation Alternative Channels and FINFET Device Structures by Siddiqui, Shahab, Chowdhury, Murshed M, Brodsky, Maryjane, Rahim, Nilufa, Dai, Min, Krishnan, Siddarth, Fugardi, Steve, Wu, Ernest, Chou, Anthony, Narasimha, Shreesh, Li, Jinghong, Mcstay, Kevin, Linder, Barry, Maciejewski, Edward, Rettmann, Ryan, Mittl, Steven, Kwon, Unoh, Narayanan, Vijay, Henson, William, Schepis, Dominic, Chudzik, Michael

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High performance 65 nm SOI technology with dual stress liner and low capacitance SRAM cell by Leobandung, E., Nayakama, H., Mocuta, D., Miyamoto, K., Angyal, M., Meer, H.V., McStay, K., Ahsan, I., Allen, S., Azuma, A., Belyansky, M., Bentum, R.-V., Cheng, J., Chidambarrao, D., Dirahoui, B., Fukasawa, M., Gerhardt, M., Gribelyuk, M., Halle, S., Harifuchi, H., Harmon, D., Heaps-Nelson, J., Hichri, H., Ida, K., Inohara, M., Inouc, I.C., Jenkins, K., Kawamura, T., Kim, B., Ku, S.-K., Kumar, M., Lane, S., Liebmann, L., Logan, R., Melville, I., Miyashita, K., Mocuta, A., O'Neil, P., Ng, M.-F., Nogami, T., Nomura, A., Norris, C., Nowak, E., Ono, M., Panda, S., Penny, C., Radens, C., Ramachandran, R., Ray, A., Rhee, S.-H., Ryan, D., Shinohara, T., Sudo, G., Sugaya, F., Strane, J., Tan, Y., Tsou, L., Wang, L., Wirbeleit, F., Wu, S., Yamashita, T., Yan, H., Ye, Q., Yoneyama, D., Zamdmer, D., Zhong, H., Zhu, H., Zhu, W., Agnello, P., Bukofsky, S., Bronner, G., Crabbe, E., Freeman, G., Huang, S.-F., Ivers, T., Kuroda, H., McHerron, D., Pellerin, J., Toyoshima, Y., Subbanna, S., Kepler, N., Su, L.

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