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Search Results - Mekhontsev, S.N.
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Infrared emittance measurements at NIST
by
Hanssen, L.M.
,
Tsai, B.K.
,
Mekhontsev, S.N.
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Status of NIST near infrared emittance measurement system
by
Hanssen, L.M.
,
Rink, M.
,
Mekhontsev, S.N.
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Temperature dependent emissivity metrology development at NIST in support of RTP needs
by
Hanssen, L.M.
,
Khromchenko, V.
,
Mekhontsev, S.N.
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Ieee Electronic Library (Iel) Conference Proceedings
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