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Search Results - Mellier, Jean-Baptiste
Search Results - Mellier, Jean-Baptiste
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Nanoscale multiply charged focused ion beam platform for surface modification, implantation, and analysis
by
Lalande, Mathieu
,
Salou, Pierre
,
Houel, Arnaud
,
Been, Thierry
,
Birou, Thierry
,
Bourin, Charles
,
Cassimi, Amine
,
Keizer, Arthur
,
Mellier, Jean-Baptiste
,
Ramillon, Jean-Marc
,
Sineau, Anthony
,
Delobbe, Anne
,
Guillous, Stéphane
Published in
Review of scientific instruments
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Technical Refinement of the Orage Ga-FIB column and Optimizing its Control for Routine Analytical Tasks
by
Hrnčíř, Tomáš
,
Rudolf, Miroslav
,
Kocman, Mikuláš
,
Mellier, Jean-Baptiste
,
Alcaraz, Laurent
,
Delobbe, Anne
Published in
Microscopy and microanalysis
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Microscopy And Microanalysis
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Review Of Scientific Instruments
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Review Of Scientific Instruments Online/Review Of Scientific Instruments
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Analytical And Instrumentation Science Symposia
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Atomic Force Microscopes
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Atomic Force Microscopy
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Condensed Matter
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Cyclotron Resonance
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Electron Cyclotron Resonance
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Engineering Sciences
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High Vacuum
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Image Resolution
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Instrumentation And Detectors
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Insulators
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Ion Beams
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Ion Implantation
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Ion Sources
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Materials Science
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Micro And Nanotechnologies
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Microelectronics
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Physics
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Scientific Apparatus & Instruments
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The Fib-Sem Laboratory: Sample Preparation And Beyond
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Oxford Journals Online
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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Cambridge University Press
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Aip Digital Archive
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Aip - American Institute Of Physics
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