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Influence of Doping Engineering in 1 μm Drift Layer Quasi‐Vertical Fin Field‐Effect Transistor for Achieving >139 V Breakdown Voltage
by
Michel, Ancy
,
I. V., Binola K. Jebalin
,
Franklin, S. Angen
,
Juliet Rani, Sylvia
,
A., Angelin Delighta
,
Nirmal, D.
Published in
Physica status solidi. A, Applications and materials science
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Physica Status Solidi. A, Applications And Materials Science
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Subjects
Breakdown
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Design Factors
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Doping
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Dopings
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Drift
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Electrical Properties
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Field Effect Transistors
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Fin Field Effect Transistors
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Gallium Nitrides
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Materials Science
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Materials Science, Multidisciplinary
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Parameter Identification
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Physical Sciences
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Physics
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Physics, Applied
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Physics, Condensed Matter
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Power Semiconductor Devices
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Quasi‐Verticals
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Science & Technology
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Semiconductor Devices
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Wiley Online Library Journals
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Wiley-Blackwell Read & Publish Collection
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