Search Results - Michinishi, Hiroyuki

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  1. 1
    Detection of knee-joint motions using two linear accelerometers for pendulum test

    Detection of knee-joint motions using two linear accelerometers for pendulum test by Kusuhara, Toshimasa, Jikuya, Kazuaki, Nakamura, Takao, Michinishi, Hiroyuki, Yamamoto, Yoshitake, Okamoto, Takuji

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  2. 2
    Model analysis of coronary hemodynamics incorporating autoregulation

    Model analysis of coronary hemodynamics incorporating autoregulation by Kagiyama, Mitsuyasu, Michinishi, Hiroyuki, Kagotani, Hiroto, Okamoto, Takuji, Ogasawara, Yasuo, Kajiya, Fumihiko

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  3. 3
    Improvement of detectability for CMOS floating gate defects in supply current test

    Improvement of detectability for CMOS floating gate defects in supply current test by Michinishi, Yokohira, Okamoto, Kobayashi, Hondo

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  4. 4
    CMOS floating gate defect detection using I/sub DDQ/ test with DC power supply superposed by AC component

    CMOS floating gate defect detection using I/sub DDQ/ test with DC power supply superposed by AC component by Michinishi, H., Yokohira, T., Okamoto, T., Kobayashi, T., Hondo, T.

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  5. 5
    Testing for the programming circuit of LUT-based FPGAs

    Testing for the programming circuit of LUT-based FPGAs by Michinishi, H., Yokohira, T., Okamoto, T., Inoue, T., Fujiwara, H.

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  6. 6
    Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

    Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs by Michinishi, H., Yokohira, T., Okamoto, T.

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  7. 7
    A test methodology for interconnect structures of LUT-based FPGAs

    A test methodology for interconnect structures of LUT-based FPGAs by Michinishi, H., Yokohira, T., Okamoto, T., Inoue, T., Fujiwara, H.

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  8. 8
    Minimum verification test set for combinational circuit

    Minimum verification test set for combinational circuit by Michinishi, H., Yokohira, T., Okamoto, T.

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  9. 9
    Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

    Minimum test sets for locally exhaustive testing of combinational circuits with five outputs by Yokohira, T., Shimizu, T., Michinishi, H., Sugiyama, Y., Okamoto, T.

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