Measurement of two particle resolution in silicon drift detectors by Pandey, S.U., Bellwied, R., Beuttenmueller, R., Caines, H., Chen, W., DiMassimo, D., Dyke, H., Hall, J., Hoffmann, G.W., Humanic, T.J., Kuczewski, P., Kotov, I.V., Kraner, H.W., Leonhardt, B., Liaw, C.J., Li, Z., Lo Curto, G., Lynn, D., Middelcamp, P., Ott, G., Pruneau, C., Rykov, V., Schambach, J., Sedlmeir, J., Sheen, J., Soja, B., Sugarbaker, E., Takahashi, J., Wilson, W.K.

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