Search Results - Milewski, Sylwester

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  1. 1
    Low Cost Hypercompression of Test Data

    Low Cost Hypercompression of Test Data by Huang, Yu, Milewski, Sylwester, Rajski, Janusz, Tyszer, Jerzy, Wang, Chen

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  2. 2
    A New Static Compaction of Deterministic Test Sets

    A New Static Compaction of Deterministic Test Sets by Eggersgluss, Stephan, Milewski, Sylwester, Rajski, Janusz, Tyszer, Jerzy

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  3. 3
    X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan

    X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan by Liu, Yingdi, Milewski, Sylwester, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Wlodarczak, Bartosz

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  4. 4
    Time and Area Optimized Testing of Automotive ICs

    Time and Area Optimized Testing of Automotive ICs by Mukherjee, Nilanjan, Tille, Daniel, Sapati, Mahendar, Liu, Yingdi, Mayer, Jeffrey, Milewski, Sylwester, Moghaddam, Elham, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

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  5. 5
    On Reduction of Deterministic Test Pattern Sets

    On Reduction of Deterministic Test Pattern Sets by Eggersglus, Stephan, Milewski, Sylwester, Rajski, Janusz, Tyszer, Jerzy

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  6. 6
    Autonomous Scan Patterns for Laser Voltage Imaging

    Autonomous Scan Patterns for Laser Voltage Imaging by Cheng, Wu-Tung, Milewski, Sylwester, Mrugalski, Grzegorz, Rajski, Janusz, Trawka, Maciej, Tyszer, Jerzy

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  7. 7
    Hypercompression of Test Patterns

    Hypercompression of Test Patterns by Huang, Yu, Milewski, Sylwester, Rajski, Janusz, Tyszer, Jerzy, Wang, Chen

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  8. 8
    X-Tolerant Tunable Compactor for In-System Test

    X-Tolerant Tunable Compactor for In-System Test by Liu, Yingdi, Milewski, Sylwester, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Włodarczak, Bartosz

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  9. 9
    Full-scan LBIST with capture-per-cycle hybrid test points

    Full-scan LBIST with capture-per-cycle hybrid test points by Milewski, Sylwester, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

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  10. 10
    Test Time and Area Optimized BrST Scheme for Automotive ICs

    Test Time and Area Optimized BrST Scheme for Automotive ICs by Mukherjee, Nilanjan, Tille, Daniel, Sapati, Mahendar, Liu, Yingdi, Mayer, Jeffrey, Milewski, Sylwester, Moghaddam, Elham, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

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  11. 11
    Low Power Test Compression with Programmable Broadcast-Based Control

    Low Power Test Compression with Programmable Broadcast-Based Control by Milewski, Sylwester, Mrugalski, Grzegorz, Rajski, Janusz, Tyszer, Jerzy

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  12. 12
    Amplitude Weighting of Linear Frequency Modulated Chirp Signals

    Amplitude Weighting of Linear Frequency Modulated Chirp Signals by Milewski, Andrzej, Sedek, Edward, Gawor, Sylwester

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  13. 13
    Amplitude Weighting of Linear Frequency Modulated Chirp Signals

    Amplitude Weighting of Linear Frequency Modulated Chirp Signals by Milewski, A., Sedek, E., Gawor, S.

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