Validating expert systems by O'Leary, T.J., Goul, M., Moffitt, K.E., Radwan, A.E.

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The BELLE silicon vertex detector by Alimonti, G, Aihara, H, Alexander, J, Asano, Y, Bakich, A, Bożek, A, Banaś, E, Browder, T, Dragic, J, Fukunaga, C, Gordon, A, Guler, H, Everton, C, Heenan, E, Haba, J, Hazumi, M, Hastings, N, Hara, T, Hojo, T, Higuchi, T, Iwai, G, Ishino, H, Jałocha, P, Korotuschenko, K, Kaneko, J, Kapusta, P, Kawasaki, T, Lange, J.S, Li, Y, Marlow, D, Moloney, G, Moffitt, L, Mori, S, Matsubara, T, Nakadaira, T, Nakamura, T, Natkaniec, Z, Okuno, S, Olsen, S, Ostrowicz, W, Pałka, H, Peak, L.S, Ryuko, J, Różańska, M, Sevior, M, Shimada, J, Sumisawa, K, Stock, R, Stanič, S, Swain, S, Taylor, G, Takasaki, F, Tajima, H, Trabelsi, K, Tamura, N, Tanaka, J, Tanaka, M, Takahashi, S, Tomura, T, Tsuboyama, T, Tsujita, Y, Varner, G, Varvell, K.E, Watanabe, Y, Yamamoto, H, Yamada, Y, Yokoyama, M, Zhao, H, Žontar, D

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