Search Results - Molis, Steve

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  1. 1
    Evaluation of Barrier CMP Slurries and Characterization of ULK Material Properties Shifts Due to CMP

    Evaluation of Barrier CMP Slurries and Characterization of ULK Material Properties Shifts Due to CMP by Tseng, Wei-Tsu, Kioussis, Dimitri, Manikonda, Shravanthi L., Kim, Hyun-Ki, Choi, Jihong, Zhao, Feng, Economikos, Laertis, Klymko, Nancy, Chace, Mark, Molis, Steve, Chae, Moosung, Engbrecht, Edward, Zielinski, Eden, Truong, Connie, Watts, David

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  2. 2
    Post Implant Strip Optimization for 90nm and Beyond Technologies

    Post Implant Strip Optimization for 90nm and Beyond Technologies by Fuller, N.C.M., Santiago, A., Mello, K., Chienfan Yu, Molis, S.

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    Ultrathin (5-35 nm) SiCNH Dielectrics for Damascene Cu Cap Application: Thickness Scaling and Oxidation Barrier Performance Limitation

    Ultrathin (5-35 nm) SiCNH Dielectrics for Damascene Cu Cap Application: Thickness Scaling and Oxidation Barrier Performance Limitation by Nguyen, Son V., Haigh, Thomas, Shaw, Thomas, Molis, Steven, Dziobkowski, Chet, Zahakos, C., Cohen, Steve, Shobha, Hosadurga, Liniger, E., Hu, C. K., Bonilla, Griselda, Klymko, Nancy, Grill, Alfred

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    Market: Lawyers, FA Should Have Averted Refunding Meltdown

    Market: Lawyers, FA Should Have Averted Refunding Meltdown by Goldsmith, Steve, Molis, Jim

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