Search Results - Mondt, Roel De

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  1. 1
    ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots

    ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots by Vercammen, Yannick, Van Luppen, Jaymes, Van Roost, Christiaan, De Mondt, Roel, Vangaever, Frank, Van Vaeck, Luc

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  2. 2
    Complementary use of Fourier transform laser microprobe mass spectrometry and time-of-flight static secondary ion mass spectrometry for the study of the surface adsorption of organic dyes on silicate materials

    Complementary use of Fourier transform laser microprobe mass spectrometry and time-of-flight static secondary ion mass spectrometry for the study of the surface adsorption of organ... by Busuioc, Alina-Maria, Mondt, Roel De, Moisio, Harri, Cool, Pegie, Vasile, Aurelia, Bilba, Nicolae, Vansant, Etienne, Vaeck, Luc Van

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  3. 3
    Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale

    Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale by Vercammen, Yannick, De Mondt, Roel, Van Luppen, Jaymes, Vangaever, Frank, Van Vaeck, Luc

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  4. 4
    Multi-slice computed tomography with N1177 identifies ruptured atherosclerotic plaques in rabbits

    Multi-slice computed tomography with N1177 identifies ruptured atherosclerotic plaques in rabbits by Van Herck, Jozef Leo, De Meyer, Guido R. Y., Martinet, Wim, Salgado, Rodrigo A., Shivalkar, Bharati, De Mondt, Roel, Van De Ven, Helene, Ludwig, Annick, Van Der Veken, Pieter, Van Vaeck, Luc, Bult, Hidde, Herman, Arnold G., Vrints, Christiaan J.

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  5. 5
    In Situ Temperature-Time Effect on MetA-S-SIMS

    In Situ Temperature-Time Effect on MetA-S-SIMS by De Mondt, Roel, Van Vaeck, Luc, Lenaerts, Jens

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  6. 6
    Study of the Affinity of Thermographic Additives for Silver by Time-of-Flight Static Secondary Ion Mass Spectrometry and Surface-Enhanced Raman Spectroscopy on Silver Nanoparticles

    Study of the Affinity of Thermographic Additives for Silver by Time-of-Flight Static Secondary Ion Mass Spectrometry and Surface-Enhanced Raman Spectroscopy on Silver Nanoparticles by De Mondt, Roel, Baert, Kitty, Geuens, Ingrid, Van Vaeck, Luc, Hubin, Annick

    Published in Langmuir
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  7. 7
    TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology

    TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology by De Mondt, Roel, Van Vaeck, Luc, Heile, Andreas, Arlinghaus, Heinrich F, Vangaever, Frank, Lenaerts, Jens

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  8. 8
    Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions

    Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions by De Mondt, Roel, Van Vaeck, Luc, Heile, Andreas, Arlinghaus, Heinrich F., Nieuwjaer, Nicolas, Delcorte, Arnaud, Bertrand, Patrick, Lenaerts, Jens, Vangaever, Frank

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  9. 9
    Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systems

    Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systems by De Mondt, Roel, Van Vaeck, Luc, Lenaerts, Jens, Geuens, Ingrid, Van Luppen, Jaymes

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