Search Results - Motoshkin, V. V.

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  1. 1
    Effect of emission center density on the rate of degradation processes in thin-film MIM cathodes

    Effect of emission center density on the rate of degradation processes in thin-film MIM cathodes by Gaponenko, V. M., Motoshkin, V. V.

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  2. 2
    Effect of material of upper electrode on electric strength of MIS system

    Effect of material of upper electrode on electric strength of MIS system by Motoshkin, V. V.

    Published in Soviet Physics Journal
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  3. 3
    Breakdown in a two-layer film of tantalum pentoxide

    Breakdown in a two-layer film of tantalum pentoxide by Vorob'ev, G. A., Motoshkin, V. V.

    Published in Soviet Physics Journal
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  4. 4
    Mechanism of ?healing? of defects in thin dielectric Ta2O5 films

    Mechanism of ?healing? of defects in thin dielectric Ta2O5 films by Motoshkin, V. V., Mukhachev, V. A., Miller, A. A.

    Published in Soviet Physics Journal
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  5. 5
    Breakdown of thin films ?cured? with tantalum oxide

    Breakdown of thin films ?cured? with tantalum oxide by Brekhunov, V. I., Motoshkin, V. V., Mukhachev, V. A.

    Published in Soviet Physics Journal
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  6. 6
    Vacuum breakdown of silicon monoxide thin-film capacitors

    Vacuum breakdown of silicon monoxide thin-film capacitors by Rudnev, A. N., Motoshkin, V. V., Tarkhanov, A. A.

    Published in Soviet Physics Journal
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  7. 7
    Moisture-resistance of SiO2 films

    Moisture-resistance of SiO2 films by Danilina, T. I., Motoshkin, V. V., Vedernikov, V. A., Mukhacheva, N. S.

    Published in Soviet Physics Journal
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