Measurements of cooling by room-temperature thermionic emission across a nanometer gap by Hishinuma, Yoshikazu, Geballe, Theodore H., Moyzhes, Boris Y., Kenny, Thomas W.

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Qualitative understanding of the highest Tc cuprates by Geballe, T.H., Moyzhes, Boris Y.

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Graded tunnelling barrier and oxygen concentration in thermally grown ultrathin SiOx gate oxide by Gitlin, Daniel, Karp, James, Moyzhes, Boris

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Graded tunnelling barrier and oxygen concentration in thermally grown ultrathin SiO x gate oxide by Gitlin, Daniel, Karp, James, Moyzhes, Boris

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Vacuum thermionic refrigeration with a semiconductor heterojunction structure by Hishinuma, Yoshikazu, Moyzhes, Boris Y., Geballe, Theodore H., Kenny, Thomas W.

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Current through SiO2 gate oxide and its low frequency fluctuations: Trapping on charged dangling bonds with negative Hubbard U by Moyzhes, Boris, Geballe, Theodore H., Jeong, Steve, Gitlin, Daniel, Karp, James

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Understanding degradation and breakdown of SiO2 gate dielectric with “negative Hubbard U” dangling bonds by Karp, James, Gitlin, Daniel, Jeong, Steve, Moyzhes, Boris

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Current through Si O 2 gate oxide and its low frequency fluctuations: Trapping on charged dangling bonds with negative Hubbard U by Moyzhes, Boris, Geballe, Theodore H., Jeong, Steve, Gitlin, Daniel, Karp, James

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Dangling bonds with “negative Hubbard U  ”: Physical model for degradation of SiO2 gate dielectric under voltage stress by Gitlin, Daniel, Karp, James, Moyzhes, Boris

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On O super(16) -O super(18) Isotope Effects in Manganese Perovskites by Geballe, TH, Moyzhes, Boris Y

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On O16 -O18 Isotope Effects in Manganese Perovskites by Geballe, Th, Moyzhes, Boris Y

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Josephson tunnelling spectroscopy of negative U centers by Oganesyan, Vadim, Kivelson, Steven, Geballe, Theodore, Moyzhes, Boris

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