Search Results - Mozhaev, R. K.

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  1. 1
    Optical Glasses Transmittance Reduction Under Gamma Radiation Exposure at Different Temperatures

    Optical Glasses Transmittance Reduction Under Gamma Radiation Exposure at Different Temperatures by Baluev, A. A., Mozhaev, R. K., Lukashin, V. P., Pechenkin, A. A.

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  2. 2
    High-speed spectrometer based on a silicon CCD-array matrix for transient changes measuring in optical radiation spectra

    High-speed spectrometer based on a silicon CCD-array matrix for transient changes measuring in optical radiation spectra by Minibaev, T. I., Ukolov, D. S., Mozhaev, R. K., Nikiforov, A. Yu

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  3. 3
    Application of Confocal Microscopy Methods for Research and Non-destructive Examination of Semiconductor Structures and Integrated Circuits

    Application of Confocal Microscopy Methods for Research and Non-destructive Examination of Semiconductor Structures and Integrated Circuits by Baluev, A. A., Ukolov, D. S., Pechenkin, A. A., Mozhaev, R. K.

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  4. 4
    Evaluation of Organic Light-Emitting Diodes Total Ionizing Dose Sensitivity in Temperature Range

    Evaluation of Organic Light-Emitting Diodes Total Ionizing Dose Sensitivity in Temperature Range by Mozhaev, R. K., Pechenkin, A. A., Ukolov, D. S., Ulanova, A. V., Nikiforov, A. Yu

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  5. 5
    Radiation Hardness Evaluation of LEDs Based on InGaN, GaN and AlInGaP Heterostructures

    Radiation Hardness Evaluation of LEDs Based on InGaN, GaN and AlInGaP Heterostructures by Ukolov, D. S., Chirkov, N. A., Mozhaev, R. K., Pechenkin, A. A.

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  6. 6
    Practical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit

    Practical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit by Novikov, S. V., Cherniak, M. E., Mozhaev, R. K., Boychenko, D. V.

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  7. 7
    Comparative Assessment of Digital and UHF Optoelectronic Transceivers Radiation Hardness

    Comparative Assessment of Digital and UHF Optoelectronic Transceivers Radiation Hardness by Mozhaev, R. K., Cherniak, M. E., Pechenkin, A. A., Ulanova, A. V., Nikiforov, A. Y.

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  8. 8
    Estimation technique for LED sensitivity to structural damage based on minority carriers lifetime measurements

    Estimation technique for LED sensitivity to structural damage based on minority carriers lifetime measurements by Mozhaev, R. K., Cherniak, M. E., Ulanova, A. V., Nikiforov, A. Y.

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