Low-Power Scan Operation in Test Compression Environment by Czysz, D., Kassab, M., Xijiang Lin, Mrugalski, G., Rajski, J., Tyszer, J.

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Ring generators - new devices for embedded test applications by Mrugalski, G., Rajski, J., Tyszer, J.

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Low-Power Test Data Application in EDT Environment Through Decompressor Freeze by Czysz, D., Mrugalski, G., Rajski, J., Tyszer, J.

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X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector by Rajski, J., Tyszer, J., Mrugalski, G., Wu-Tung Cheng, Mukherjee, N., Kassab, M.

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Fault Diagnosis With Convolutional Compactors by Mrugalski, G., Pogiel, A., Rajski, J., Tyszer, J.

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Embedded deterministic test for low cost manufacturing test by Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N., Thompson, R., Kun-Han Tsai, Hertwig, A., Tamarapalli, N., Mrugalski, G., Eide, G., Jun Qian

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Low Power Scan Shift and Capture in the EDT Environment by Czysz, D., Kassab, M., Lin, X., Mrugalski, G., Rajski, J., Tyszer, J.

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High performance dense ring generators by Mrugalski, G., Mukherjee, M., Rajski, J., Tyszer, J.

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Low power compression of incompatible test cubes by Czysz, D, Mrugalski, G, Mukherjee, N, Rajski, J, Szczerbicki, P, Tyszer, J

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Dynamic channel allocation for higher EDT compression in SoC designs by Kassab, M, Mrugalski, G, Mukherjee, N, Rajski, J, Janicki, J, Tyszer, J

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Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression by Czysz, Dariusz, Mrugalski, G., Mukherjee, N., Rajski, J., Szczerbicki, P., Tyszer, Jerzy

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Cellular automata-based test pattern generators with phase shifters by Mrugalski, G., Rajski, J., Tyszer, J.

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EDT Bandwidth Management in SoC Designs by Janicki, J., Kassab, M., Mrugalski, G., Mukherjee, N., Rajski, J., Tyszer, J.

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Ring Generator: An Ultimate Linear Feedback Shift Register by Mukherjee, N, Rajski, J, Mrugalski, G, Pogiel, A, Tyszer, J

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High speed ring generators and compactors of test data [logic IC test] by Mrugalski, G., Rajski, J., Tyszer, J.

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Test generator with preselected toggling for low power built-in self-test by Rajski, J., Tyszer, J., Mrugalski, G., Nadeau-Dostie, B.

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Fault diagnosis in designs with convolutional compactors by Mrugalski, G., Pogiel, A., Rajski, J., Tyszer, J., Chen Wang

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Low power programmable PRPG with enhanced fault coverage gradient by Solecki, J., Tyszer, J., Mrugalski, G., Mukherjee, N., Rajski, J.

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Planar high performance ring generators by Mrugalski, G., Mukherjee, N., Rajski, J., Tyszer, J.

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Compression based on deterministic vector clustering of incompatible test cubes by Mrugalski, G., Mukherjee, N., Rajski, J., Czysz, D., Tyszer, J.

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