Search Results - Murguia, J.E.

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  1. 1
    Short-time failure of metal interconnect caused by current pulses

    Short-time failure of metal interconnect caused by current pulses by Murguia, J.E., Bernstein, J.B.

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  2. 2
    Schottky base edge leakage in Si permeable-base transistors

    Schottky base edge leakage in Si permeable-base transistors by Murguia, J.E.

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  3. 3
    Improved drift in two-phase, long-channel, shallow buried-channel CCDs with longitudinally nonuniform storage-gate implants

    Improved drift in two-phase, long-channel, shallow buried-channel CCDs with longitudinally nonuniform storage-gate implants by Lattes, A.L., Munroe, S.C., Seaver, M.M., Murguia, J.E., Melngailis, J.

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  4. 4
    Use and attitudes of obstetricians toward 3 high-risk interventions in MFMU Network hospitals

    Use and attitudes of obstetricians toward 3 high-risk interventions in MFMU Network hospitals by Bousleiman, Sabine Zoghbi, RN, MSN, MSPH, Rice, Madeline Murguia, PhD, Moss, Joan, RNC, MSN, Todd, Allison, RN, MSN, Rincon, Monica, MD, CCRP, Mallett, Gail, RN, BSN, CCRC, Milluzzi, Cynthia, RN, Allard, Donna, RN, Dorman, Karen, RN, MS, Ortiz, Felecia, RN, BSN, Johnson, Francee, RN, BSN, Reed, Peggy, RN, CCRP, Tolivaisa, Susan, BS

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