Search Results - Muthumali DeSilva, Kokge Thilini Kanchana

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    Highly sensitive optical interferometric technique reveals stress-dependent instantaneous nanometric growth fluctuations of Chinese chive leaf under heavy metal stress

    Highly sensitive optical interferometric technique reveals stress-dependent instantaneous nanometric growth fluctuations of Chinese chive leaf under heavy metal stress by Muthumali DeSilva, Kokge Thilini Kanchana, Rajagopalan, Uma Maheswari, Kadono, Hirofumi

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