Pseudo-dielectric function spectra of the near surface layer of GaAs implanted with various fluence of Xe+ ions by Tuan, P.L., Kulik, M., Phuc, T.V., Madadzada, A.I., Zelenyak, T.Yu, Turek, M., Żuk, J., Mita, C., Stanculescu, A., Doroshkevich, A.S., Jasinska, B., Khiem, L.H., Anh, N.N., My, N.T. Bao

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