Bulk micro-defect detection with low-angle illumination by Szarvas, T., Molnár, G., Nádudvari, Gy, Tóth, Sz, Almásy, O., Spindler, Sz, Erdei, D., Pothorszky, Sz, Kretschmer, R., Bauer, S.

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Application of light scattering tomography for Si(111) samples by Szarvas, T., Pothorszky, Sz, Erdei, D., Molnár, G., Nádudvari, Gy, Almásy, O., Spindler, Sz, Kretschmer, R., Bauer, S.

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Mid-low energy implantation tilt angle monitoring with photomodulated reflectance measurement by Ujhelyi, F., Pongracz, A., Kun, A., Szivos, J., Bartal, B., Fodor, B., Bolcskei-Molnar, A., Nadudvari, Gy, Byrnes, J., Rubin, Leonard M.

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Tilt angle and dose rate monitoring of low energy ion implantation processes with photomodulated reflectance measurement : AM: Advanced Metrology by Pongracz, A., Szivos, J., Ujhelyi, F., Zolnai, Zs, Sepsi, O., Kun, a., Nadudvari, Gy, Byrnes, J., Rubin, Leonard M., Moore, Edward D.

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Changes in peroxidase isoenzyme patterns of wheat during ripening and storage by N dudvari-M rkus, Vikt ria, P rk ny-Gy rf s, Anna, V mos-Vigy z, Lilly

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