Search Results - NAUGHTON, JOHN J

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  1. 1
    Using Ion Implantation to Streamline High Volt Processing in Standard CMOS

    Using Ion Implantation to Streamline High Volt Processing in Standard CMOS by Naughton, John J, Towner, Janet M

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  2. 2
    Characterizing Dopant Contamination Using Ion Implantation

    Characterizing Dopant Contamination Using Ion Implantation by Naughton, John J, Towner, Janet M

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  3. 3
    Dopant influence on polysilicon capacitor oxide failure

    Dopant influence on polysilicon capacitor oxide failure by Towner, J.M., Naughton, J.J.

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  4. 4
    Automating Metal Lift-Off for Mass MEMS Production

    Automating Metal Lift-Off for Mass MEMS Production by Naughton, John J., Franklin, Patrick

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  5. 5
    Polysilicon Interface Engineering for Improved PIP Capacitors

    Polysilicon Interface Engineering for Improved PIP Capacitors by Towner, Janet M., Naughton, John, Prasad, Jagdish

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  6. 6
    Integration Challenges in Standard CMOS with Multiple Gate Oxide Thicknesses

    Integration Challenges in Standard CMOS with Multiple Gate Oxide Thicknesses by Naughton, John J., Towner, Janet

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  7. 7
    Salicide Integration Optimization for Improved Yield

    Salicide Integration Optimization for Improved Yield by Towner, Janet M., Naughton, John J.

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  8. 8
    High Volt Mixed Signal Integration Challenges

    High Volt Mixed Signal Integration Challenges by Tyler, Matthew, Naughton, John J.

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  9. 9
    Zero Defectivity Dual Gate Processing

    Zero Defectivity Dual Gate Processing by Towner, Janet M., Naughton, John J., Lappan, Raymond

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  10. 10
    Integrating a CMP Robust ILD Module

    Integrating a CMP Robust ILD Module by Naughton, John J., Towner, Janet M., Aytes, S., Nelson, M. M.

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  11. 11
    Integrated Precision Polysilicon Resistors

    Integrated Precision Polysilicon Resistors by Towner, Janet M., Naughton, John J., Thomason, Mike W.

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  12. 12
    The Effect of Wafer Substrate Resistance on Inter Poly Oxide Thickness Variation

    The Effect of Wafer Substrate Resistance on Inter Poly Oxide Thickness Variation by Towner, J.M., Naughton, J.J.

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  13. 13
    A Method of Manufacturing a Low Defect, Low Stress Pre-metal Dielectric Stack for High Reliability and MEMs Applications

    A Method of Manufacturing a Low Defect, Low Stress Pre-metal Dielectric Stack for High Reliability and MEMs Applications by Naughton, J.J., Nelson, M.M.

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  14. 14
    Reliable High Volt Mixed Signal IC Manufacturing

    Reliable High Volt Mixed Signal IC Manufacturing by Naughton, J.J., Tyler, M., Anser, M.

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  15. 15
    Challenges of Manufacturing Capacitor Oxide in Mixed Signal ASICS

    Challenges of Manufacturing Capacitor Oxide in Mixed Signal ASICS by Towner, J.M., Naughton, J.J.

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  16. 16
    Possible Use of Argon-39 in the Potassium-Argon Method of Age Determination

    Possible Use of Argon-39 in the Potassium-Argon Method of Age Determination by NAUGHTON, JOHN J

    Published in Nature (London)
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  17. 17
    Helium Flux from the Earth's Mantle as Estimated from Hawaiian Fumarolic Degassing

    Helium Flux from the Earth's Mantle as Estimated from Hawaiian Fumarolic Degassing by Naughton, John J., Lee, J. H., Keeling, Diana, Finlayson, J. B., Dority, Guy

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  18. 18
    Measurement of Intergranular Diffusion in a Silicate System: Iron in Forsterite

    Measurement of Intergranular Diffusion in a Silicate System: Iron in Forsterite by NAUGHTON, JOHN J, FUJIKAWA, YASUO

    Published in Nature (London)
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  19. 19
    Calculation of Chemical Equilibria in Volcanic Systems by Means of Computers

    Calculation of Chemical Equilibria in Volcanic Systems by Means of Computers by HEALD, EMERSON F, NAUGHTON, JOHN J

    Published in Nature (London)
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  20. 20
    Relation of Chemical Structure to Irritant Responses in Marine Fish

    Relation of Chemical Structure to Irritant Responses in Marine Fish by HIATT, ROBERT W, NAUGHTON, JOHN J, MATTHEWS, DONALD C

    Published in Nature (London)
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