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Search Results - Nafi, Thahmidul Islam
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High Accuracy Swin Transformers for Imagebased Wafer Map Defect Detection
by
Islam Nafi, Thahmidul
,
Haque, Erfanul
,
Farhan, Faisal
,
Rahman, Asif
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International Journal of Engineering and Manufacturing
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High Accuracy Swin Transformers for Image-based Wafer Map Defect Detection
by
Thahmidul Islam Nafi
,
Haque, Erfanul
,
Farhan, Faisal
,
Rahman, Asif
Published in
International Journal of Engineering and Manufacturing
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ANN based approach to predict criminal trends in Bangladesh
by
Farhan, Faisal
,
Nafi, Thahmidul Islam
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International Journal Of Engineering And Manufacturing
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Algorithms
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Ann
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Anomalies
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Artificial Intelligence
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Artificial Neural Networks
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Computer Vision
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Crime
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Datasets
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Deep Learning
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Defective Products
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Defects
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Law Enforcement
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Linear Regression
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Police
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Abi/Inform Global
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Ieee Electronic Library (Iel) Conference Proceedings
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