Search Results - Nakakura, Craig

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    Resolving the Electron Plume within a Scanning Electron Microscope

    Resolving the Electron Plume within a Scanning Electron Microscope by Alcorn, Francis M., Perez, Christopher, Smoll, Eric J., Hoang, Lauren, Nitta, Frederick U., Mannix, Andrew J., Talin, A. Alec, Nakakura, Craig Y., Chandler, David W., Kumar, Suhas

    Published in ACS nano
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  2. 2
    High-Throughput SEM via Multi-Beam SEM: Applications in Materials Science

    High-Throughput SEM via Multi-Beam SEM: Applications in Materials Science by Michael, Joseph R., Nakakura, Craig Y., Garbowski, Tomasz, Lena Eberle, Anna, Kemen, Thomas, Zeidler, Dirk

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    Atomic force microscopy monitoring of subcritical slow crack growth in soda lime silicate glass

    Atomic force microscopy monitoring of subcritical slow crack growth in soda lime silicate glass by Nakakura, Craig, Duree, Jessica, Stephens, Kelly, Strong, Kevin, Grutzik, Scott, Rimsza, Jessica

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