Search Results - Nanataki, Fugo

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    Microscopic physical origin of charge traps in 3D NAND flash memories

    Microscopic physical origin of charge traps in 3D NAND flash memories by Nanataki, Fugo, Iwata, Jun-Ichi, Chokawa, Kenta, Araidai, Masaaki, Oshiyama, Atsushi, Shiraishi, Kenji

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    Atomic and electronic structures of nitrogen vacancies in silicon nitride: Emergence of floating gap states

    Atomic and electronic structures of nitrogen vacancies in silicon nitride: Emergence of floating gap states by Nanataki, Fugo, Shiraishi, Kenji, Iwata, Jun-ichi, Matsushita, Yu-ichiro, Oshiyama, Atsushi

    Published in Physical review. B
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