Liquid immersion lens technology applied to laser voltage probing of 130 nm process technology devices by Nataraj, Nagamani, Deslandes, Herve, Lo, William, Eiles, Travis, Pardy, Patrick

Get full text

Fault localization using time resolved photon emission and stil waveforms by Nataraj, N., Lundquist, T., Ketan Shah

Request full text

Device-Associated Infection Rates in 20 Cities of India, Data Summary for 2004–2013: Findings of the International Nosocomial Infection Control Consortium by Mehta, Yatin, Jaggi, Namita, Rosenthal, Victor Daniel, Kavathekar, Maithili, Sakle, Asmita, Munshi, Nita, Chakravarthy, Murali, Todi, Subhash Kumar, Saini, Narinder, Rodrigues, Camilla, Varma, Karthikeya, Dubey, Rekha, Kazi, Mohammad Mukhit, Udwadia, F. E., Myatra, Sheila Nainan, Shah, Sweta, Dwivedy, Arpita, Karlekar, Anil, Singh, Sanjeev, Sen, Nagamani, Limaye-Joshi, Kashmira, Ramachandran, Bala, Sahu, Suneeta, Pandya, Nirav, Mathur, Purva, Sahu, Samir, Singh, Suman P., Bilolikar, Anil Kumar, Kumar, Siva, Mehta, Preeti, Padbidri, Vikram, Gita, N., Patnaik, Saroj K., Francis, Thara, Warrier, Anup R., Muralidharan, S., Nair, Pravin Kumar, Subhedar, Vaibhavi R., Gopinath, Ramachadran, Azim, Afzal, Sood, Sanjeev

Get full text