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Search Results - Nayal, Amit Singh
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Analyzing stress-strength reliability δ=P[U<V<W]: a Bayesian and frequentist perspective with Burr-XII distribution under progressive Type-II censoring
by
Nayal, Amit Singh
,
Singh, Bhupendra
,
Tripathi, Vrijesh
,
Tyagi, Abhishek
Published in
International journal of system assurance engineering and management
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Comprehensive antifungal investigation of green synthesized silver nanoformulation against four agriculturally significant fungi and its cytotoxic applications
by
Singh, Jyoti
,
Kumar, Ankit
,
Nayal, Amit Singh
,
Vikal, Sagar
,
Shukla, Gyanika
,
Singh, Amardeep
,
Singh, Anupma
,
Goswami, Sakshi
,
Kumar, Ashwani
,
Gautam, Yogendra K.
,
Verma, Yeshvandra
,
Gaurav, Shailendra Singh
,
Pratap, Dharmendra
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Scientific reports
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Estimation of $$P[Y<Z]$$ under Geometric-Lindley model
by
Singh, Bhupendra
,
Nayal, Amit Singh
,
Tyagi, Abhishek
Published in
Ricerche di matematica
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Inferences on stress-strength reliability $$R=\text{ P }[Y<X<Z]$$ for progressively type-II censored Weibull half logistic distribution
by
Nayal, Amit Singh
,
Tyagi, Abhishek
,
Rathi, Shubhi
,
Singh, Bhupendra
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Opsearch
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Analyzing stress-strength reliability $$\delta =\text{ P }[U<V<W]$$: a Bayesian and frequentist perspective with Burr-XII distribution under progressive Type-II censoring
by
Nayal, Amit Singh
,
Singh, Bhupendra
,
Tripathi, Vrijesh
,
Tyagi, Abhishek
Published in
International journal of system assurance engineering and management
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