Search Results - Nazuka, Yutaro

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  1. 1
    Nanoscale evaluation of structure and surface potential of gated field emitters by scanning Maxwell-stress microscope

    Nanoscale evaluation of structure and surface potential of gated field emitters by scanning Maxwell-stress microscope by ITOH, J, NAZUKA, Y, INOUE, T, YOKOYAMA, H, KANEMARU, S, SHIMIZU, K

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  2. 2
    Nanoscale Evaluation of Structure and Surface Potential of Gated Field Emitters by Scanning Maxwell-Stress Microscope

    Nanoscale Evaluation of Structure and Surface Potential of Gated Field Emitters by Scanning Maxwell-Stress Microscope by Itoh, Junji, Nazuka, Yutaro, Inoue, Takahito, Yokoyama, Hiroshi, Kanemaru, Seigo, Keizo Shimizu, Keizo Shimizu

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    Depth Profile of Impurity Phase in Wide-Bandgap Cu(In1−x,Gax)Se2 Film Fabricated by Three-Stage Process

    Depth Profile of Impurity Phase in Wide-Bandgap Cu(In1−x,Gax)Se2 Film Fabricated by Three-Stage Process by Wang, Shenghao, Nazuka, Takehiro, Hagiya, Hideki, Takabayashi, Yutaro, Ishizuka, Shogo, Shibata, Hajime, Niki, Shigeru, Islam, Muhammad M., Akimoto, Katsuhiro, Sakurai, Takeaki

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