Search Results - Neerinck, D.G.

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  1. 1
    Depth profiling of thin ITO films by grazing incidence X-ray diffraction

    Depth profiling of thin ITO films by grazing incidence X-ray diffraction by NEERINCK, D. G, VINK, T. J

    Published in Thin solid films
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  2. 2
    Influence of grain size on the transport properties of Ni/sub 80/Fe/sub 20/ and Cu thin films

    Influence of grain size on the transport properties of Ni/sub 80/Fe/sub 20/ and Cu thin films by Rijks, T.G.S.M., Sour, R.L.H., Neerinck, D.G., De Veirman, A.E.M., Coehoorn, R., Kools, J.C.S., Gillies, M.F., de Jonge, W.J.M.

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  3. 3
    Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films

    Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films by NEERINCK, D. G, DE VEIRMAN, A. E. M, SLANGEN, M. H. J, RIJKS, T. G. S. M, KOOLS, J. C. S

    Published in Thin solid films
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  4. 4
    The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition

    The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition by de Keijser, M., de Leeuw, D.M., van Veldhoven, P.J., De Veirman, A.E.M., Neerinck, D.G., Dormans, G.J.M.

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  5. 5
    Grain size and strain in thin sputter-deposited Ni 0.8Fe 0.2 and Cu films

    Grain size and strain in thin sputter-deposited Ni 0.8Fe 0.2 and Cu films by Neerinck, D.G., De Veirman, A.E.M., Slangen, M.H.J., Rijks, Th.G.S.M., Kools, J.C.S.

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