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Moisture absorption and desorption in epoxy mould compounds: Characterization of Fickian and non-Fickian behaviours in complex packages
by
Tomas, Ariane
,
Frémont, Hélène
,
Malbert, Nathalie
,
Neffati, Mehdy
,
Lambert, Benoit
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Microelectronics and reliability
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Reliability of Fan-Out Wafer Level Packaging For III-V RF Power MMICs
by
Tomas, Ariane
,
Marechal, Laurent
,
Almeida, Rodrigo
,
Neffati, Mehdy
,
Malbert, Nathalie
,
Fremont, Helene
,
Labat, Nathalie
,
Garnier, Arnaud
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System in package embedding III-V chips by fan-out wafer-level packaging for RF applications
by
Garnier, Arnaud
,
Castagne, Laetitia
,
Greco, Florent
,
Guillemet, Thomas
,
Marechal, Laurent
,
Neffati, Mehdy
,
Franiatte, Remi
,
Coudrain, Perceval
,
Piotrowicz, Stephane
,
Simon, Gilles
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Microelectronics And Reliability
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Special Issue Of 34Th European Symposium On Reliability Of Electron Devices, Failure Physics And Analysis, Esref 2023
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Chip Formation
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