Search Results - Ngow, Y.T.

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    Diagnostic-driven yield engineering under atypical wafer foundry conditions

    Diagnostic-driven yield engineering under atypical wafer foundry conditions by Ngow, Y.T., Goh, S.H.

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    Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA

    Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA by Goh, S.H., Chun, Tay Chee, Ngow, Y.T., Yeoh, B.L., Susanto, Edy, Hao, Hu, Thor, MH, Lin, Zhao, Chan, Y.H., Lam, Jeffrey

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