Search Results - Niestadt, Marcel

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  1. 1
    Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

    Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV by Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Haider, Max, Niestadt, Marcel, Bischoff, Maarten, Biskupek, Johannes, Lee, Zhongbo, Lehnert, Tibor, Börrnert, Felix, Rose, Harald, Kaiser, Ute

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  2. 2
    Sub-Å STEM Resolution From 30-300kV

    Sub-Å STEM Resolution From 30-300kV by Bischoff, Maarten, Niestadt, Marcel, Altin, Veli, Henstra, Alexander, Tiemeijer, Peter, Freitag, Bert, Maunders, Christian, Hartel, Peter, Van Cappellen, Eric

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  3. 3
    Performance Evaluation of Dual Bruker XFlash6 | 100 EDS Detector Integrated in FEI Themis With Analytical Objective Pole Piece

    Performance Evaluation of Dual Bruker XFlash6 | 100 EDS Detector Integrated in FEI Themis With Analytical Objective Pole Piece by Yücelen, Emrah, Ovsyanko, Mikhail, Cats, Dennis, Niestadt, Marcel, Oosting, Michiel, Jongenelen, Vincent, Richter, Heike, van Engelshoven, Jeroen, Foord, David

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  4. 4
    Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

    Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV by Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Biskupek, Johannes, Niestadt, Marcel, Kaiser, Ute, Haider, Max

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