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Search Results - Nittala, Lakshmi N.
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Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy
by
Bogle, Stephanie N.
,
Nittala, Lakshmi N.
,
Twesten, Ray D.
,
Voyles, Paul M.
,
Abelson, John R.
Published in
Ultramicroscopy
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Nanometer-scale order in amorphous Ge2Sb2Te5 analyzed by fluctuation electron microscopy
by
Kwon, Min-Ho
,
Lee, Bong-Sub
,
Bogle, Stephanie N.
,
Nittala, Lakshmi N.
,
Bishop, Stephen G.
,
Abelson, John R.
,
Raoux, Simone
,
Cheong, Byung-ki
,
Kim, Ki-Bum
Published in
Applied physics letters
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Nanometer-scale order in amorphous Ge 2 Sb 2 Te 5 analyzed by fluctuation electron microscopy
by
Kwon, Min-Ho
,
Lee, Bong-Sub
,
Bogle, Stephanie N.
,
Nittala, Lakshmi N.
,
Bishop, Stephen G.
,
Abelson, John R.
,
Raoux, Simone
,
Cheong, Byung-ki
,
Kim, Ki-Bum
Published in
Applied physics letters
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Applied Physics Letters
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Amorphous Materials
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Amorphous Silicon
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Correlation
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Medium-Range Order
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