Search Results - Nixon, W.C.

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  1. 1
    Electron beam induced potential contrast on unbiased planar transistors

    Electron beam induced potential contrast on unbiased planar transistors by Chang, T.H.P., Nixon, W.C.

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  2. 2
    An electron optical line source for microelectronic engineering

    An electron optical line source for microelectronic engineering by Brodie, A.D., Nixon, W.C.

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  3. 3
    Accurate electron beam waveform measurement on high density integrated circuits

    Accurate electron beam waveform measurement on high density integrated circuits by Garth, S.C.J., Nixon, W.C., Spicer, D.F.

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  4. 4
    Ultra high speed electron beam testing system

    Ultra high speed electron beam testing system by Thong, J.T.L., Garth, S.C.J., Breton, B.C., Nixon, W.C.

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  5. 5
    A dynamic real time 3-D measurement technique for IC inspection

    A dynamic real time 3-D measurement technique for IC inspection by Breton, B.C., Thong, J.T.L., Nixon, W.C.

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  6. 6
    Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope

    Optimisation and applications of the Cambridge University 600 kV high resolution electron microscope by Smith, David J., Camps, R.A., Cosslett, V.E., Freeman, L.A., Saxton, W.O., Nixon, W.C., Ahmed, H., Catto, C.J.D., Cleaver, J.R.A., Smith, K.C.A., Timbs, A.E.

    Published in Ultramicroscopy
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  7. 7
    Paper-tape-controlled electron probe resist exposure and direct metallic deposition

    Paper-tape-controlled electron probe resist exposure and direct metallic deposition by Dix, C., Ballantyne, J.P., Nixon, W.C.

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  8. 8
    Property rights & the perceived health contribution of public open space in Hong Kong

    Property rights & the perceived health contribution of public open space in Hong Kong by Lai, Lawrence W.C., Ho, Daniel C.W., Chau, K.W., Yu, Esther Y.T., Lam, Cindy L.K., Leung, Nixon T.H., Davies, Stephen N.G.

    Published in Land use policy
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