Search Results - Nofal, Issam

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  1. 1
    Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs

    Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs by Jinhyun Noh, Correas, Vincent, Soonyoung Lee, Jongsung Jeon, Nofal, Issam, Cerba, Jacques, Belhaddad, Hafnaoui, Alexandrescu, Dan, YoungKeun Lee, Kwon, Steve

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  2. 2
    A Layout-Based Rad-Hard DICE Flip-Flop Design

    A Layout-Based Rad-Hard DICE Flip-Flop Design by Wang, Haibin, Dai, Xixi, Ibrahim, Younis Mohammed Younis, Sun, Hongwen, Nofal, Issam, Cai, Li, Guo, Gang, Shen, Zicai, Chen, Li

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  3. 3
    Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research

    Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research by Gu, Cheng, Belev, George, Tian, Haonan, Shi, Shuting, Nofal, Issam, Wen, Shijie, Chen, Li

    Published in Applied sciences
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  4. 4
    A 65 nm Temporally Hardened Flip-Flop Circuit

    A 65 nm Temporally Hardened Flip-Flop Circuit by Li, Y.-Q, Wang, H.-B, Rui Liu, Li Chen, Nofal, Issam, Chen, Q.-Y, He, A.-L, Gang Guo, Baeg, Sang H., Shi-Jie Wen, Wong, Richard, Qiong Wu, Mo Chen

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  5. 5
    Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation

    Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation by Glorieux, Maximilien, Bonnoit, Thierry, Lange, Thomas, Gaillard, Remi, Nofal, Issam, Artola, Laurent, Poivey, Christian, Levacq, David, Rey, Romain, Heikki, Kettunen, Polo, Cesar Boatella

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  6. 6
    Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology

    Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology by Gu, Cheng, Chen, Rui, Belev, George, Shi, Shuting, Tian, Haonan, Nofal, Issam, Chen, Li

    Published in Materials
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  7. 7
    A single event upset tolerant latch design

    A single event upset tolerant latch design by Wang, Haibin, Dai, Xixi, Wang, Yangsheng, Nofal, Issam, Cai, Li, Shen, Zicai, Sun, Wanxiu, Bi, Jinshun, Li, Bo, Guo, Gang, Chen, Li, Baeg, Sang

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  8. 8
    Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree

    Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree by Li, Yuanqing, Chen, Li, Nofal, Issam, Chen, Mo, Wang, Haibin, Liu, Rui, Chen, Qingyu, Krstic, Milos, Shi, Shuting, Guo, Gang, Baeg, Sang H., Wen, Shi-Jie, Wong, Richard

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  9. 9
    EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety

    EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety by Alexandrescu, Dan, Evans, Adrian, Glorieux, Maximilien, Nofal, Issam

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  10. 10
    General surgery educational resources for Jordanian medical students

    General surgery educational resources for Jordanian medical students by Nofal, Mohammad Nebih, Al Awayshish, Mahmoud Mousa, Yousef, Ali Jad, Alamaren, Ammar Masoud, Al-Rabadi, Zaid Issam, Haddad, Dina Samer, Al-Rbaihat, Yaqeen Ahmad, Al-Qusous, Yazeed Nabeel

    Published in Surgery open science
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  11. 11
    Comparison of helical, maximum intensity projection (MIP), and averaged intensity (AI) 4D CT imaging for stereotactic body radiation therapy (SBRT) planning in lung cancer

    Comparison of helical, maximum intensity projection (MIP), and averaged intensity (AI) 4D CT imaging for stereotactic body radiation therapy (SBRT) planning in lung cancer by Bradley, Jeffrey D., Nofal, Ahmed N., El Naqa, Issam M., Lu, Wei, Liu, Jubei, Hubenschmidt, James, Low, Daniel A., Drzymala, Robert E., Khullar, Divya

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