Search Results - Nuernbergk, D.

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  1. 1
    Test circuits for fast and reliable assessment of CDM robustness of I/O stages

    Test circuits for fast and reliable assessment of CDM robustness of I/O stages by Stadler, W., Esmark, K., Reynders, K., Zubeidat, M., Graf, M., Wilkening, W., Willemen, J., Qu, N., Mettler, S., Etherton, M., Nuernbergk, D., Wolf, H., Gieser, H., Soppa, W., De Heyn, V., Natarajan, M., Groeseneken, G., Morena, E., Stella, R., Andreini, A., Litzenberger, M., Pogany, D., Gornik, E., Foss, C., Konrad, A., Frank, M.

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  2. 2
    Design rules for n-type SiGe hetero FETs

    Design rules for n-type SiGe hetero FETs by König, U., Glück, M., Gruhle, A., Höck, G., Kohn, E., Bozon, B., Nuernbergk, D., Ostermann, T., Hagelauer, R.

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  3. 3
    Embedded EEPROM design in PD-SOI for application in an extended temperature range (−40° C up to 200° C)

    Embedded EEPROM design in PD-SOI for application in an extended temperature range (−40° C up to 200° C) by Richter, Sonja, Kirsten, Dagmar, Richter, Steffen, Nuernbergk, Dirk

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  4. 4
    An improved velocity overshoot model for submicron-gate MESFETs

    An improved velocity overshoot model for submicron-gate MESFETs by Schwierz, F., Roßerg, M., Nuernbergk, D., Schipanski, D., Förster, H., Liou, J.J.

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  5. 5
    Dependence of the cut off frequency on Ge profiles, base and collector widths in SiGe HBTs

    Dependence of the cut off frequency on Ge profiles, base and collector widths in SiGe HBTs by Mau, H., Nuernbergk, D., Schwierz, F., Rossberg, M., Paasch, G., Schipanski, D.

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  6. 6
    Requirements and restrictions in optimizing homogeneous and planar doped barrier vertical MOSFETs

    Requirements and restrictions in optimizing homogeneous and planar doped barrier vertical MOSFETs by Scheinert, S., Paasch, G., Kittler, M., Nuernbergk, D., Mau, H., Schwierz, F.

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  7. 7
    Recent advances in Si/SiGe HBT research

    Recent advances in Si/SiGe HBT research by Schwierz, F., Rossberg, M., Forster, H., Nuernbergk, D., Schipanski, D.

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  8. 8
    Critical optical power density in PIN-photodiodes

    Critical optical power density in PIN-photodiodes by Meister, M., Reinhard, M., Liebold, U., Kirsten, D., Nuernbergk, D. M.

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  9. 9
    Differences in ac-analysis of Si/Si/sub 1-x/Ge/sub x/ HBTs using drift-diffusion and hydrodynamic based device simulators

    Differences in ac-analysis of Si/Si/sub 1-x/Ge/sub x/ HBTs using drift-diffusion and hydrodynamic based device simulators by Forster, H., Nuernbergk, D., Schwierz, F., Schipanski, D.

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  10. 10
    On the temperature behavior of Si/SiGe/Si-HBT: comparison between measurements and numerical simulation

    On the temperature behavior of Si/SiGe/Si-HBT: comparison between measurements and numerical simulation by Nuernbergk, D.M., Forster, H., Schwierz, F., Yuan, J.S., Paasch, G.

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  11. 11
    Comparison of Monte Carlo, energy transport, and drift-diffusion simulations for a Si/SiGe/Si HBT

    Comparison of Monte Carlo, energy transport, and drift-diffusion simulations for a Si/SiGe/Si HBT by Nuernbergk, D.M., Forster, H., Schwierz, F., Yuan, J.S., Paasch, G.

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