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On twin density and resistivity of nanometric Cu thin films
by
Barmak, Katayun
,
Liu, Xuan
,
Darbal, Amith
,
Nuhfer, N. Thomas
,
Choi, Dooho
,
Sun, Tik
,
Warren, Andrew P.
,
Coffey, Kevin R.
,
Toney, Michael F.
Published in
Journal of applied physics
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Journal Of Applied Physics
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Applied Physics
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Boundaries
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Classical And Quantum Mechanics, General Physics
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Comparative Evaluations
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Copper
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Crystal Structure
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Crystals
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Density
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Electrical Resistivity
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Encapsulation
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Errors
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Grain Size
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Length
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Nanostructures
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Parameters
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Physical Sciences
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Physics
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Physics, Applied
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Scattering
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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