Femtosecond laser ablation (fs-LA) XPS – A novel XPS depth profiling technique for thin films, coatings and multi-layered structures by Baker, M.A., Bacon, S.R., Sweeney, S.J., Hinder, S.J., Bushell, A., Nunney, T.S., White, R.G.

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The blocking of the step-mediated indirect channel to hydrogen dissociation by oxygen on Pt(5 3 3) by Gee, A.T, Hayden, B.E, Mormiche, C, Nunney, T.S

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Synchrotron far-infrared RAIRS studies of complex molecules on Cu(1 1 0) by Humblot, V., Bingham, C.J.A., Le Roux, D., Mateo Marti, E., McNutt, A., Nunney, T.S., Ortega Lorenzo, M., Roberts, A.J., Williams, J., Surman, M., Raval, R.

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The dynamics of hydrogen adsorption on polycrystalline uranium by Bazley, S.G., Nunney, T.S., Mormiche, C., Hayden, B.E.

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Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams by Strohmeier, B.R., White, R.G., Nunney, T.S., Mack, P., Wright, A.E.

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Reflection absorption infrared study of the adsorption of dimethylamine on copper (1 1 0) and nickel (1 1 1) surfaces by Chalker, S., Haq, S., Birtill, J.J., Nunney, T.S., Raval, R.

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Infrared studies of sub-monolayer methylamine and trimethylamine adsorption on Ni(111) by Nunney, T.S., Birtill, J.J., Raval, R.

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