Search Results - O. L.Krivanek

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    Enhancing the Resolution and Sensitivity of STEM by Aberration Correction

    Enhancing the Resolution and Sensitivity of STEM by Aberration Correction by Browning, N. D., Sun, K., Klie, R. F., Liu, J., Disko, M. M., Dellby, N., O. L.Krivanek

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