Search Results - Oad, Mahandar

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  1. 1
    Correlations Between In-Line X-ray Diffraction Data and In-Field Critical Current of Long, 4-μm Thick Film REBCO Tapes Made by Advanced MOCVD

    Correlations Between In-Line X-ray Diffraction Data and In-Field Critical Current of Long, 4-μm Thick Film REBCO Tapes Made by Advanced MOCVD by Goel, Chirag, Paidpilli, Mahesh, Chen, Siwei, Li, Yi, Oad, Mahandar, Zhu, Lingfeng, Majkic, Goran, Selvamanickam, Venkat

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  2. 2
    Development of 50-Meter RE-Ba-Cu-O Tapes With Critical Current Over 1750 A/12mm at 65 K, 0.25 T by Advanced-MOCVD

    Development of 50-Meter RE-Ba-Cu-O Tapes With Critical Current Over 1750 A/12mm at 65 K, 0.25 T by Advanced-MOCVD by Paidpilli, Mahesh, Goel, Chirag, Chen, Siwei, Li, Yi, Jain, Rohit, Shyam, Vinay, Oad, Mahandar, Yerraguravagari, Vamsi, Galstyan, Eduard, Majkic, Goran, Schmidt, Robert M., Rey, C. M., Carnes, T. H., Selvamanickam, Venkat

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  3. 3
    Development of 50-Meter RE-Ba-Cu-O Tapes With Critical Current Over 1750 A/12mm at 65 K, 0.25 T by Advanced-MOCVD

    Development of 50-Meter RE-Ba-Cu-O Tapes With Critical Current Over 1750 A/12mm at 65 K, 0.25 T by Advanced-MOCVD by Paidpilli, Mahesh, Goel, Chirag, Chen, Siwei, Li, Yi, Jain, Rohit, Shyam, Vinay, Oad, Mahandar, Yerraguravagari, Vamsi, Galstyan, Eduard, Majkic, Goran, Schmidt, Robert M., Rey, C. M., Carnes, T. H., Selvamanickam, Venkat

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