Search Results - Oberstar, J.D.

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  1. 1
    Boron contamination and precipitation during the growth of InP

    Boron contamination and precipitation during the growth of InP by Oberstar, J.D., Streetman, B.G., Baker, J.E., Williams, Peter, Henry, R.L., Swiggard, E.M.

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  2. 2
    Thin film encapsulants for annealing GaAs and InP

    Thin film encapsulants for annealing GaAs and InP by Oberstar, J.D, Streetman, B.G

    Published in Thin solid films
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  3. 3
    Annealing encapsulants for InP II: Photoluminescence studies

    Annealing encapsulants for InP II: Photoluminescence studies by Oberstar, J.D., Streetman, B.G.

    Published in Thin solid films
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  4. 4
    Photoluminescence studies of surface damage states in InP

    Photoluminescence studies of surface damage states in InP by Oberstar, J.D., Streetman, B.G.

    Published in Surface science
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  5. 5
    Cracking of SiO 2 layers on annealed InP

    Cracking of SiO 2 layers on annealed InP by Oberstar, J.D., Streetman, B.G., Sammann, E.A.

    Published in Thin solid films
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  6. 6
    Photoluminescence studies of surface damage states in InP

    Photoluminescence studies of surface damage states in InP by Oberstar, J.D., Streetman, B.G.

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  7. 7
    VB-11 InP annealing studies

    VB-11 InP annealing studies by Oberstar, J.D., Streetman, B.G.

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  8. 8
    Cracking of SiO2 layers on annealed InP

    Cracking of SiO2 layers on annealed InP by Oberstar, J.D., Streetman, B.G., Sammann, E.A.

    Published in Thin solid films
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  9. 9
    Annealing encapsulants for InP I: Auger electron and secondary ion mass spectrometric studies

    Annealing encapsulants for InP I: Auger electron and secondary ion mass spectrometric studies by Oberstar, J.D., Streetman, B.G., Baker, J.E., Finnegan, N.L., Sammann, E.A., Williams, Peter

    Published in Thin solid films
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