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A Rare Event Based Yield Estimation Methodology for Analog Circuits
by
Odabasi, Izel Cagin
,
Yelten, Mustafa Berke
,
Afacan, Engin
,
Baskaya, Faik
,
Pusane, Ali Emre
,
Dundar, Gunhan
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Conference Proceedings
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Analog Circuits
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Circuit Faults
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Engineering
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Engineering, Electrical & Electronic
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Integrated Circuit Modeling
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Internet Of Things
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Inverters
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Parametric Faults
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Process Variations
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Rare Event
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Science & Technology
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Technology
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Transistors
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Yield Estimation
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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