Controlling the nano-deformation of polymer by a reversible photo-cross-linking reaction by Van-Pham, Dan-Thuy, Nguyen, Minh Tri, Ohdomari, Ken, Nakanishi, Hideyuki, Norisuye, Tomohisa, Tran-Cong-Miyata, Qui

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Improvement of Focused Ion-Beam Optics in Single-Ion Implantation for Higher Aiming Precision of One-by-One Doping of Impurity Atoms into Nano-Scale Semiconductor Devices by Shinada, Takahiro, Koyama, Hikaru, Hinoshita, Chie, Imamura, Ken, Ohdomari, Iwao

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Morphology Control of Cu Clusters Formed on H-Si(111) Surface in Solution by Si Potential by Ken-ichi Hara, Ken-ichi Hara, Iwao Ohdomari, Iwao Ohdomari

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Nucleation and Growth of Cu Adsorbates on Hydrogen-Terminated Si(111) Surface in Solution by Ken-ichi Hara, Ken-ichi Hara, Takashi Tanii, Takashi Tanii, Iwao Ohdomari, Iwao Ohdomari

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Control of metal nanostructure morphology by means of applied Si potential by Hara, Ken-ichi, Ohdomari, Iwao

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Site dependence of soft errors induced by single-ion hitting in 64 kbit static random access memory (SRAM) by NORITAKE, K, MATSUKAWA, T, KOH, M, HARA, K, GOTO, M, OHDOMARI, I

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Single-event upset test of static random access memory using single-ion microprobe by MATSUKAWA, T, NORITAKE, K, KOH, M, HARA, K.-I, GOTO, M, OHDOMARI, I

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Single-ion detection using nuclear track detector CR-39 plastic by Hara, Ken-ichi, Koh, Meishoku, Matsukawa, Takashi, Tanii, Takashi, Ohdomari, Iwao

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Identification of soft-error sensitive junction in SRAM's using a single ion microprobe by Matsukawa, T., Kishida, A., Koh, M., Hara, K.-I., Horita, K., Goto, M., Matsuda, S., Kuboyama, S., Ohdomari, I.

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Reverse-mode single ion beam induced charge (R-mode SIBIC) imaging for the test of total dose effects in n-ch metal-oxide-semiconductor field-effect transistor (MOSFET) by KOH, M, HARA, K.-I, HORITA, K, SHIGETA, B, MATSUKAWA, T, KISHIDA, A, TANII, T, GOTO, M, OHDOMARI, I

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