Diamond formation from methane hydrate under the internal conditions of giant icy planets by Kadobayashi, Hirokazu, Ohnishi, Satoka, Ohfuji, Hiroaki, Yamamoto, Yoshitaka, Muraoka, Michihiro, Yoshida, Suguru, Hirao, Naohisa, Kawaguchi-Imada, Saori, Hirai, Hisako

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Fabrication of layer-by-layer graphene oxide thin film on copper substrate by electrophoretic deposition by Ye, Nan, Ohnishi, Satoka, Okada, Mitsuhiro, Hatakeyama, Kazuto, Seki, Kazuhiko, Kubo, Toshitaka, Shimizu, Tetsuo

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Melting relations in the MgO–MgSiO3 system up to 70 GPa by Ohnishi, Satoka, Kuwayama, Yasuhiro, Inoue, Toru

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GD-OES Measurement of Trace Element in Plating by Ohnishi, Satoka, Yoshida, Masaoki, Yamauchi, Yasuo

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Measurement of Silicon Oxide Film Thickness by X-ray Photoelectron Spectroscopy with ISO 14701 by Yamauchi, Yasuo, Oizumi, Shoya, Ohnishi, Satoka

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Measurement of Silicon Oxide Film Thickness by X-ray Photoelectron Spectroscopy with ISO 14701 by Yamauchi, Yasuo, Oizumi, Shoya, Ohnishi, Satoka

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GD-OESを用いためっき中微量元素特定手法の検討 by 大西, 里佳, 吉田, 正沖, 山内, 康生

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ISO 14701にもとづく X線光電子分光法によるシリコン酸化膜厚の測定 by 山内, 康生, 大泉, 翔也, 大西, 里佳

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