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    Data-driven sensitivity analysis in surface structure determination using total-reflection high-energy positron diffraction (TRHEPD)

    Data-driven sensitivity analysis in surface structure determination using total-reflection high-energy positron diffraction (TRHEPD) by Hoshi, Takeo, Sakata, Daishiro, Oie, Shotaro, Mochizuki, Izumi, Tanaka, Satoru, Hyodo, Toshio, Hukushima, Koji

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    Data-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si\(_4\)O\(_5\)N\(_3\) / 6H-SiC (0001)-(\(\sqrt{3} \times \sqrt{3}\)) R30\(^\circ\)

    Data-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si\(_4\)O\(_5\)N\(_3\) / 6H-SiC (0001)-(\(\sqrt{3} \times \sqrt{3... by Hoshi, Takeo, Sakata, Daishiro, Oie, Shotaro, Mochizuki, Izumi, Tanaka, Satoru, Hyodo, Toshio, Hukushima, Koji

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