Challenges of III-V materials in advanced CMOS logic by Kirsch, P. D., Hill, R. J. W., Huang, J., Loh, W. Y., Kim, T.-W, Wong, M. H., Min, B. G., Huffman, C., Veksler, D., Young, C. D., Ang, K. W., Ali, I., Lee, R. T. P., Ngai, T., Wang, A., Wang, W.-E, Cunningham, T. H., Chen, Y. T., Hung, P. Y., Bersch, E., Sassman, B., Cruz, M., Trammell, S., Droopad, R., Oktybrysky, S., Lee, J. C., Bersuker, G., Hobbs, C., Jammy, R.

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