Operational status of the Belle II Time-Of-Propagation counter readout and data acquisition system by Maeda, Y., Andrew, M., Atmacan, H., Bessner, M., Gaz, A., Hartbrich, O., Hirata, H., Iijima, T., Inami, K., Macchiarulo, L., Matsuoka, K., Muroyama, G., Neverov, D., Nisar, N.K., Nishimura, K., Okuto, R., Savinov, V., Senga, S., Suzuki, K., Tsuzuki, N., Varner, G.S.

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Development of High-Field and High-Pressure ESR System and Application to Triangular Antiferromagnet CsCuCl3 by Okuto, Ryosuke, Ohki, Eito, Sakurai, Takahiro, Hijii, Keigo, Takahashi, Hideyuki, Ohmichi, Eiji, Okubo, Susumu, Ohta, Hitoshi, Uwatoko, Yoshiya, Tanaka, Hidekazu

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Threshold energy effect on avalanche breakdown voltage in semiconductor junctions by Okuto, Y., Crowell, C.R.

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Ionization coefficients in semiconductors: A nonlocalized property by Okuto, Y., Crowell, C. R.

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Energy-Conservation Considerations in the Characterization of Impact Ionization in Semiconductors by Okuto, Y., Crowell, C. R.

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