Search Results - Oldham, H.E.

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  1. 1
    A comparative study of CMOS processes for VLSI applications

    A comparative study of CMOS processes for VLSI applications by Oldham, H.E., Partridge, S.L.

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  2. 2
    Laser testing of integrated circuits

    Laser testing of integrated circuits by Smith, J.G., Oldham, H.E.

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  3. 3
    A 2nd Generation 32b RISC Processor with 4KByte Cache

    A 2nd Generation 32b RISC Processor with 4KByte Cache by Thomas, A.R.P., Urquhart, J.S., Howard, D.W., Oldham, H.E., Furber, S.B.

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  4. 4
    FPA10-A 4 MFLOP floating point coprocessor for ARM

    FPA10-A 4 MFLOP floating point coprocessor for ARM by Harrod, P.L., Baum, A.J., Biggs, J.P., Howard, D.W., Merritt, A.J., Oldham, H.E., Seal, D.J., Watters, H.L.

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  5. 5
    The nature of the trapped hole annealing process

    The nature of the trapped hole annealing process by Lelis, A.J., Oldham, T.R., Boesch, H.E., McLean, F.B.

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  6. 6
    Reversibility of trapped hole annealing

    Reversibility of trapped hole annealing by Lelis, A.J., Boesch, H.E., Oldham, T.R., McLean, F.B.

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  7. 7
    The nature of the trapped hold annealing process

    The nature of the trapped hold annealing process by Lelis, A.J., Oldham, T.R., Boesch, H.E. Jr, McLean, F.B.

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